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Volumn 87, Issue 3, 2001, Pages 135-145

Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging

Author keywords

Boron; Detection limit; Electron energy loss spectroscopy; Elemental mapping

Indexed keywords

CHARGE COUPLED DEVICES; CONCENTRATION (PROCESS); ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; PHOTODIODES; SHOT NOISE; STATISTICS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035044436     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00094-2     Document Type: Article
Times cited : (17)

References (15)
  • 5
    • 0005120472 scopus 로고    scopus 로고
    • D.R. Liu, L.M. Brown, Developments in electron microscopy and analysis, Institute of Physics Conference Series, Vol. 61, I.O.P, Bristol, 1982, pp. 201-204.
  • 8
    • 0005174303 scopus 로고    scopus 로고
    • C.B. Boothroyd, K. Sato, K. Yamada in: Proceedings of the XII International Congress on Electron Microscopy, Vol. 2, San Francisco Press, San Francisco, 1990, pp. 80-81.
  • 12
    • 0005176721 scopus 로고    scopus 로고
    • R.F. Egerton, Y.Y. Yang, S.C. Cheng, Ultramicroscopy 48 (1993) 239.
  • 13
    • 0005217230 scopus 로고    scopus 로고
    • R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Publishing Co., New York, 1996.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.