Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 535-546

  Lazar, S ^a   Botton, G A ^b   Wu, M Y ^a   Tichelaar, F D ^a   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

Bandgap; GaN; HREELS; Near edge structures; TiO2 (brookite)

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; MATERIALS SCIENCE; OPTICAL RESOLVING POWER; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY;

BANDGAP; MOMENTUM TRANSFER;

IMAGING TECHNIQUES;

GALLIUM; NITROGEN; OXYGEN; POTASSIUM; TITANIUM;

CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; COMMERCIAL PHENOMENA; CONFERENCE PAPER; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; EXPERIMENT; LOW ENERGY LOSS SPECTROSCOPY; MATERIALS; MECHANICAL PROBE; SCIENCE; SPECTROMETER; SPECTROSCOPY; SPECTRUM; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

ANGUILLIFORMES;

EID: 0038502004     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00114-1     Document Type: Conference Paper

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