메뉴 건너뛰기




Volumn 63, Issue 1, 1996, Pages 21-25

Improved imaging of secondary phases in solids by energy-filtering TEM

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; DIFFRACTION; IMAGING TECHNIQUES; IONIZATION; LIGHTING; OPTICAL FILTERS; SOLIDS; VISUALIZATION;

EID: 0030128867     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00048-4     Document Type: Article
Times cited : (60)

References (25)
  • 6
    • 0002654964 scopus 로고
    • ed. J.M. Goringe The Institute of Physics, Bristol and London
    • [6] M.N. Thompson, Inst. Phys. Conf. Ser. No. 61. ed. J.M. Goringe (The Institute of Physics, Bristol and London, 1982) pp. 83-86.
    • (1982) Inst. Phys. Conf. Ser. , vol.61 , pp. 83-86
    • Thompson, M.N.1
  • 12
    • 0024257021 scopus 로고
    • Scanning Microscopy International AMF O'Hare, Chicago
    • [12] N. Bonnet, C. Colliex, C. Mory and M. Tence, in: Scanning Microscopy, Suppl. 2, Scanning Microscopy International (AMF O'Hare, Chicago, 1988) pp. 351-364.
    • (1988) Scanning Microscopy , Issue.SUPPL. 2 , pp. 351-364
    • Bonnet, N.1    Colliex, C.2    Mory, C.3    Tence, M.4
  • 14
    • 0002687042 scopus 로고
    • eds. A.D. Romig and W.F. Chambers San Francisco Press, San Francisco
    • [14] R.D. Leapman, in: Microbeam Analysis-1986, eds. A.D. Romig and W.F. Chambers (San Francisco Press, San Francisco, 1986) pp. 187-191.
    • (1986) Microbeam Analysis-1986 , pp. 187-191
    • Leapman, R.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.