Asymmetries in electron Compton profiles of silicon - A coherence effect

Ultramicroscopy

Volumn 65, Issue 3-4, 1996, Pages 131-145

  Exner, Alfred ^a,b   Schattschneider, Peter ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Inst Stromungslehre W   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; NUMERICAL ANALYSIS; REFLECTION; SEMICONDUCTING SILICON; TRANSMISSION ELECTRON MICROSCOPY; VECTORS; WAVE INTERFERENCE;

BLOCH WAVES; BRAGG REFLECTIONS; COMPTON PROFILES; EWALD SPHERES; SCATTERING CROSS SECTION;

ELECTRON SCATTERING;

ARTICLE; ELECTRON MICROSCOPY;

EID: 0030271461     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00060-5     Document Type: Article

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