Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique

Journal of Electron Microscopy

Volumn 50, Issue 5, 2001, Pages 377-382

  Kimoto, Koji ^a   Matsui, Yoshio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Energy filtering transmission electron microscope; Fourier images; Inelastic scattering; Lattice fringe; Low loss electron; Spatially resolved EELS

Indexed keywords

ARTICLE;

ANGUILLIFORMES;

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; FOURIER TRANSFORMS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY-LOSS SPECTROSCOPIES; ENERGY FILTERING; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPE; FOURIER IMAGES; LATTICE FRINGES; LOSS ELECTRONS; LOW-LOSS; LOW-LOSS ELECTRON; SPATIALLY RESOLVED; SPATIALLY-RESOLVED ELECTRON ENERGY-LOSS SPECTROSCOPY; TRANSMISSION ELECTRON;

INELASTIC SCATTERING;

EID: 0035685315     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.5.377     Document Type: Article

References (13)

1. Atomic structure images formed by plasma-loss electrons
2. Lattice imaging using plasmon energy-loss electrons in an energy-filtered transmission electron microscope
3. Chemical shift mapping of Si L and K edges using spatially-resolved EELS and energy-filtering TEM
4. Analyses of composition and chemical shift of silicon oxynitride film using EFTEM-based spatially-resolved EELS
5. Experimental evidence for the collective nature of the characteristic energy loss of electrons in solids - Studies on the dispersion relation of plasma frequency
6. A method for determining the coefficient of spherical aberration from a single electron micrograph
7. Theoretical basis of image-deconvolution method for structure images of thin crystal
8. Das elektronenmikroskopische Bild von Netzebenenscharen und sein Kontrast
9. The observation of crystal lattices with an electron microscope