Secondary fluorescence correction formulae for X-ray microanalysis - I parallel-sided thin foil, wedge, and bulk specimens

Ultramicroscopy

Volumn 68, Issue 2, 1997, Pages 77-94

  Anderson, I M ^a,b   Bentley, J ^a   Carter, C B ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Minnesota   (United States)

Author keywords

X ray microanalysis

Indexed keywords

FLUORESCENCE; X RAY ANALYSIS;

SECONDARY FLUORESCENCE; X RAY MICROANALYSIS;

X RAY MICROSCOPES;

ARTICLE; CALCULATION; ELECTRON PROBE MICROANALYSIS; FLUORESCENCE; RADIATION SCATTERING; X RAY MICROANALYSIS;

EID: 0031570660     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00015-6     Document Type: Article

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