The orientation-dependent simulation of ELNES

Ultramicroscopy

Volumn 83, Issue 1-2, 2000, Pages 9-16

  Hebert Souche C ^a   Louf, P H ^a   Blaha, P ^a   Nelhiebel, M ^b   Luitz, J ^a   Schattschneider, P ^a   Schwarz, K ^a   Jouffrey, B ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Grande Voie des Vignes   (France)

Author keywords

DOS; Electron energy loss spectroscopy (EELS); Energy loss near edge structure (ELNES); Simulation; XANES

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL STRUCTURE; ELECTRON SCATTERING; ELECTRON TRANSITIONS; INTEGRATION; VECTORS;

ENERGY-LOSS NEAR EDGE STRUCTURE (ELNES); SCATTERING VECTOR; SOFTWARE PACKAGE WIEN97;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ANISOTROPY; ARTICLE; BINOCULAR CONVERGENCE; CALCULATION; DECOMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; SIMULATION;

EID: 0005910257     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00168-0     Document Type: Article

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