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Volumn 96, Issue 3-4, 2003, Pages 491-508
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Elemental occurrence maps: A starting point for quantitative EELS spectrum image processing
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Author keywords
Edge detection; EELS spectrum imaging; MLLS fitting
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Indexed keywords
CERAMIC MATERIALS;
COMPOSITION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
IMAGE ANALYSIS;
STEEL;
SIGNAL OVERLAPS;
IMAGING TECHNIQUES;
ALLOY;
NICKEL COMPLEX;
STEEL;
ANALYSIS;
AUTOMATION;
CERAMICS;
CONFERENCE PAPER;
ELECTRON ENERGY LOSS SPECTROSCOPY;
FEASIBILITY STUDY;
IMAGE ANALYSIS;
IMAGING;
OPERATOR;
QUANTITATIVE ANALYSIS;
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EID: 0038502006
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(03)00111-6 Document Type: Conference Paper |
Times cited : (16)
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References (22)
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