메뉴 건너뛰기




Volumn 96, Issue 3-4, 2003, Pages 491-508

Elemental occurrence maps: A starting point for quantitative EELS spectrum image processing

Author keywords

Edge detection; EELS spectrum imaging; MLLS fitting

Indexed keywords

CERAMIC MATERIALS; COMPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; STEEL;

EID: 0038502006     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00111-6     Document Type: Conference Paper
Times cited : (16)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.