Localization in elastic and inelastic scattering

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 313-322

  Lupini, A R ^a,b   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Mailstop 6031 ^*  (United States)

Author keywords

Aberration; Coherence; Cs correction; Delocalization; EELS; Localization; STEM

Indexed keywords

CRYSTALS; IMAGING TECHNIQUES; RADIATION DETECTORS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

INELASTIC SCATTERING;

ELECTROMAGNETIC WAVE SCATTERING;

TITANIUM;

CONFERENCE PAPER; CRYSTAL STRUCTURE; DISPERSION; DYNAMICS; ELASTICITY; GEOMETRY; IMAGING SYSTEM; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037825707     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00096-2     Document Type: Conference Paper

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