Multivariate statistical analysis of STEM-EDX data from radiation- induced sensitization in stainless steel

Journal of Microscopy

Volumn 188, Issue 3, 1997, Pages 224-236

  Titchmarsh, J M ^a   Dumbill, S ^b  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b Harwell Lab   (United Kingdom)

Author keywords

Multivariate statistical analysis; Principal component; Radiation induced segregation (RIS); Segregation; STEM EDX

Indexed keywords

MULTIVARIANT ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; SEGREGATION (METALLOGRAPHY); STAINLESS STEEL; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY-DISPERSIVE X-RAYS; MULTIVARIATE STATISTICAL ANALYSIS; PREIRRADIATION; PRINCIPAL COMPONENTS; RADIATION-INDUCED; RADIATION-INDUCED SEGREGATION; SEGREGATION; SENSITISATION; STEM-EDX;

GRAIN BOUNDARIES;

CHROMIUM; IRON; MOLYBDENUM; NICKEL; PHOSPHORUS; SILICON; STAINLESS STEEL;

ARTICLE; DATA ANALYSIS; MULTIVARIATE ANALYSIS; NEUTRON RADIATION; PRIORITY JOURNAL; SENSITIZATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROMETRY;

EID: 0343968958     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.2610817.x     Document Type: Article

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