Background subtraction for low-loss transmission electron energy-loss spectroscopy

Ultramicroscopy

Volumn 93, Issue 1, 2002, Pages 25-37

  Reed, B W ^a   Sarikaya, M ^a  

^a University of Washington   (United States)

Author keywords

Electron energy loss spectroscopy

Indexed keywords

ALGORITHMS; CARBON NANOTUBES; RANDOM ERRORS; SIGNAL TO NOISE RATIO; SPECTROMETERS;

BACKGROUND SPECTRA;

ELECTRON SPECTROSCOPY;

ALGORITHM; ANALYTICAL ERROR; ARTICLE; ARTIFACT REDUCTION; CURVE FITTING; DEVICE; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; METHODOLOGY; MODEL; PARAMETER; SAMPLE; SIGNAL NOISE RATIO; SPECTROMETER; STANDARD;

EID: 0036806529     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00146-8     Document Type: Article

References (24)

1. R.F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum, New York, 1996, pp. 245-277.
2. Johnson D.W., Spence J.C.H. J. Phys. D. 7:1974;771.
3. Egerton R.F., Williams B.G., Sparrow T.G. Proc. R. Soc. London A. 398:1985;395.
4. Natusch M.K.H., Botton G.A., Humphreys C.J. Inst. Phys. Conf. Ser. 157:1997;213.
5. Dorneich A.D., French R.H., Müllejans H., Loughin S., Rühle M. J. Microsc. 191:1997;286.
6. Müllejans H., French R.H. Microsc. Microanal. 6:2000;297.
7. Tougaard S. J. Vac. Sci. Technol A. 5:1987;1275.
8. Chorkendorff I., Tougaard S. Appl. Surf. Sci. 29:1987;101.
9. Vicanek M. Surf. Sci. 440:1999;1.
10. Egerton R.F., Crozier P.A. Scanning Microsc. Suppl. 2:1988;245.
11. Reed B.W., Chen J.M., MacDonald N.C., Silcox J., Bertsch G.F. Phys. Rev. B. 60:1999;5641.
12. Reed B.W., Sarikaya M., Dalton L.R., Bertsch G.F. Appl. Phys. Lett. 78(21):2001;3358-3360.
13. Reed B.W., Sarikaya M. Phys. Rev. B. 64:2001;195404.
14. http://depts.washington.edu/bionano/EELS.
15. Bonnet N., Colliex C., Mory C., Tencé M. Scanning Microsc. Suppl. 2:1988;351.
16. Manoubi T., Tencé M., Walls M.G., Colliex C. Microsc. Microanal. Microstruct. 1:1990;23.
17. Egerton R.F. Ultramicroscopy. 9:1982;387.
18. Muller D.A., Silcox J. Ultramicroscopy. 59:1995;195.
19. Bevington P.R. Data Reduction and Error Analysis for the Physical Sciences. 1969;McGraw-Hill, New York.
20. Lin M.F., Chuu D.S., Huang C.S., Lin Y.K., Shung K.W.-K. Phys. Rev. B. 53:1996;15493.
21. Lin M.F., Chuu D.S. Phys. Rev. B. 57:1998;10183.
22. Pichler T., Knupfer M., Golden M.S., Fink J., Rinzler A., Smalley R.E. Phys. Rev. Lett. 80:1998;4729.
23. Bonnet N., Hannequin P. Ultramicroscopy. 28:1989;248.
24. Bonnet N., Brun N., Colliex C. Ultramicroscopy. 77:1999;97.