Improved quantification of grain boundary segregation by EDS in a dedicated STEM

Ultramicroscopy

Volumn 69, Issue 2, 1997, Pages 105-116

  Alber, U ^a   Mullejans H ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

CuBi; Energy dispersive X ray spectroscopy (EDS); Grain boundaries; Quantification; Scanning transmission electron microscope (STEM); Segregation

Indexed keywords

BISMUTH; COMPOSITION EFFECTS; COPPER; CRYSTAL IMPURITIES; DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; EMBRITTLEMENT; SCANNING ELECTRON MICROSCOPY; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

BEAM BROADENING; ENERGY DISPERSIVE X RAY SPECTROSCOPY (EDXS);

GRAIN BOUNDARIES;

BISMUTH; COPPER;

ARTICLE; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN; MICROSCOPE IMAGE; MODEL; QUANTITATIVE ASSAY; SCANNING ELECTRON MICROSCOPY; THICKNESS; X RAY SPECTROMETRY;

EID: 0343052722     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00036-3     Document Type: Article

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