Maximum-entropy deconvolution applied to electron energy-loss spectroscopy

Micron

Volumn 31, Issue 4, 2000, Pages 325-331

  Overwijk, M H F ^a   Reefman, D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Carbon K edge; Deconvolution; Electron energy loss spectra; Maximum entropy deconvolution; Resolution improvement; Signal to noise ratio; Super resolution; Transmission electron microscopy

Indexed keywords

EID: 0034059470     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00111-0     Document Type: Article

References (16)

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