Towards atomic column-by-column spectroscopy

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 141-151

  Rafferty, B ^a   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC COLUMN-BY-COLUMN SPECTROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); Z CONTRAST IMAGING;

ELECTRON SPECTROSCOPY;

ATOMIC PARTICLE; CONFERENCE PAPER; ELASTICITY; ELECTRON BEAM; ELECTRON DIFFRACTION; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; OPTICAL RESOLUTION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPE; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033007184     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00033-9     Document Type: Conference Paper

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