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Volumn 29, Issue 5, 1998, Pages 349-357

Optimization of the signal to noise ratio in EFTEM elemental maps with regard to different eonization edge types

Author keywords

Electron energy loss spectroscopy; Energy filtering transmission electron microscopy; Signal to noise ratio; Spatial resolution

Indexed keywords


EID: 0032191945     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(98)00014-6     Document Type: Article
Times cited : (63)

References (31)
  • 1
    • 0020269267 scopus 로고
    • Alternative background fitting for electron energy-loss spectra
    • ed G. W. Bailey Claitor's, Baton Rouge.
    • Bentley, J., Lehmann, G. L., Sklad, P. S., 1982. Alternative background fitting for electron energy-loss spectra. In Proc. 40th Annual EMSA Meeting, ed G. W. Bailey, pp. 496 497. Claitor's, Baton Rouge.
    • (1982) In Proc. 40th Annual EMSA Meeting , pp. 496497
    • Bentley, J.1    Lehmann, G.L.2    Sklad, P.S.3
  • 2
    • 0010405777 scopus 로고
    • Quantitative elemental concentrations by energy-filtered imaging
    • eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec Jones and Begell, New York.
    • Bentley, J., Hall, E. L., Kenik, E. A., 1995. Quantitative elemental concentrations by energy-filtered imaging. In Proc. Microscopy and Microanalysis 1995, eds G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, pp. 268 269. Jones and Begell, New York.
    • (1995) In Proc. Microscopy and Microanalysis 1995 , pp. 268269
    • Bentley, J.1    Hall, E.L.2    Kenik, E.A.3
  • 4
    • 0000072114 scopus 로고
    • Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope
    • Berger A., Kohl H. Optimum imaging parameters for elemental mapping in an energy filtering transmission electron microscope. Optik. 4:1993;175-193.
    • (1993) Optik , vol.4 , pp. 175-193
    • Berger, A.1    Kohl, H.2
  • 5
    • 0000408349 scopus 로고
    • Elemental mapping using an imaging energy-filter: Image formation and resolution limits
    • Berger A., Kohl H. Elemental mapping using an imaging energy-filter: image formation and resolution limits. Microsc. Microanal. Microstr. 3:1993;159-174.
    • (1993) Microsc. Microanal. Microstr. , vol.3 , pp. 159-174
    • Berger, A.1    Kohl, H.2
  • 7
    • 0024257021 scopus 로고
    • Developments in processing image sequences for elemental mapping
    • Scanning Microscopy International, Chicago, IL.
    • Bonnet, N., Colliex, C., Mory, C., Tence, M., 1988. Developments in processing image sequences for elemental mapping. Scanning Microscopy, Supplement, Vol. 2, pp. 351 364. Scanning Microscopy International, Chicago, IL.
    • (1988) Scanning Microscopy, Supplement , vol.2 , pp. 351364
    • Bonnet, N.1    Colliex, C.2    Mory, C.3    Tence, M.4
  • 8
    • 0030114747 scopus 로고    scopus 로고
    • On the application of energy-filtering TEM in materials science: II. Study of a fibre-reinforced metal matrix composite
    • Brydson R., Hofer F., Upadhyaya D., Kothleitner G., Ward-Close M., Tsakiropoulos P., Fores S. On the application of energy-filtering TEM in materials science: II. Study of a fibre-reinforced metal matrix composite. Micron. 27:1996;107-120.
    • (1996) Micron , vol.27 , pp. 107-120
    • Brydson, R.1    Hofer, F.2    Upadhyaya, D.3    Kothleitner, G.4    Ward-Close, M.5    Tsakiropoulos, P.6    Fores, S.7
  • 9
    • 0002419039 scopus 로고
    • Filtrage magnetique des vitesses en microscopie electronique
    • Castaing R., Henri L. Filtrage magnetique des vitesses en microscopie electronique. Compt. Rend. Acad. Sci. Paris. B255:1962;77-78.
    • (1962) Compt. Rend. Acad. Sci. Paris , vol.255 , pp. 77-78
    • Castaing, R.1    Henri, L.2
  • 11
    • 0002986468 scopus 로고    scopus 로고
    • Quantitative chemical phase imaging by means of energy-filtering transmission electron microscopy
    • Grogger W., Hofer F., Kothleitner G. Quantitative chemical phase imaging by means of energy-filtering transmission electron microscopy. Mikrochim. Acta. 125:1997;13-19.
    • (1997) Mikrochim. Acta , vol.125 , pp. 13-19
    • Grogger, W.1    Hofer, F.2    Kothleitner, G.3
  • 12
    • 0027621235 scopus 로고
    • Applications of a post-column imaging filter in biology and materials science
    • Gubbens A. J., Krivanek O. L. Applications of a post-column imaging filter in biology and materials science. Ultramicroscopy. 51:1993;146-159.
    • (1993) Ultramicroscopy , vol.51 , pp. 146-159
    • Gubbens, A.J.1    Krivanek, O.L.2
  • 13
    • 0029125937 scopus 로고
    • Imaging of nanometer sized precipitates in solids by electron spectroscopic imaging
    • Hofer F., Warbichler P., Grogger W. Imaging of nanometer sized precipitates in solids by electron spectroscopic imaging. Ultramicroscopy. 59:1995;15-31.
    • (1995) Ultramicroscopy , vol.59 , pp. 15-31
    • Hofer, F.1    Warbichler, P.2    Grogger, W.3
  • 14
    • 0030199091 scopus 로고    scopus 로고
    • 23-edges of the elements Sr to Mo for quantitative EELS analysis
    • 23-edges of the elements Sr to Mo for quantitative EELS analysis. Ultramicroscopy. 63:1996;239-245.
    • (1996) Ultramicroscopy , vol.63 , pp. 239-245
    • Hofer, F.1    Kothleitner, G.2    Rez, P.3
  • 16
    • 0029329273 scopus 로고
    • Energy-filtered transmission electron microscopy of SimGen superlattices and Si-Ge heterostructures: I. Experimental results
    • Jäger W., Mayer J. Energy-filtered transmission electron microscopy of SimGen superlattices and Si-Ge heterostructures: I. Experimental results. Ultramicroscopy. 59:1993;33-45.
    • (1993) Ultramicroscopy , vol.59 , pp. 33-45
    • Jäger, W.1    Mayer, J.2
  • 17
    • 0018251983 scopus 로고
    • About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolution
    • Jeanguillaume C., Trebbia P., Colliex C. About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolution. Ultramicroscopy. 3:1978;237-242.
    • (1978) Ultramicroscopy , vol.3 , pp. 237-242
    • Jeanguillaume, C.1    Trebbia, P.2    Colliex, C.3
  • 18
    • 0010322699 scopus 로고
    • The quantitation of electron energy-loss spectra
    • Joy D. C., Maher D. M. The quantitation of electron energy-loss spectra. J. Microsc. 124:1981;37-48.
    • (1981) J. Microsc. , vol.124 , pp. 37-48
    • Joy, D.C.1    Maher, D.M.2
  • 19
    • 0028649463 scopus 로고
    • Three dimensional scatter diagrams: Application to surface analytical microscopy
    • Kenny P. G., Barkshire I. R., Prutton M. Three dimensional scatter diagrams: application to surface analytical microscopy. Ultramicroscopy. 56:1994;289-301.
    • (1994) Ultramicroscopy , vol.56 , pp. 289-301
    • Kenny, P.G.1    Barkshire, I.R.2    Prutton, M.3
  • 20
    • 0000191674 scopus 로고    scopus 로고
    • Quantitative elemental mapping of stainless steel using an imaging filter
    • Kimoto K. Quantitative elemental mapping of stainless steel using an imaging filter. J. Electron Microsc. 45:1996;143-147.
    • (1996) J. Electron Microsc. , vol.45 , pp. 143-147
    • Kimoto, K.1
  • 23
    • 0029619346 scopus 로고
    • Spatial resolution in EFTEM elemental maps
    • Krivanek O. L., Kundmann M. K., Kimoto K. Spatial resolution in EFTEM elemental maps. J. Microsc. 180:1995;277-287.
    • (1995) J. Microsc. , vol.180 , pp. 277-287
    • Krivanek, O.L.1    Kundmann, M.K.2    Kimoto, K.3
  • 24
    • 0002517343 scopus 로고    scopus 로고
    • Attainable resolution of energy-selecting image using high-voltage electron microscope
    • Kurata H., Moriguchi S., Isoda S., Kobayashi T. Attainable resolution of energy-selecting image using high-voltage electron microscope. J. Electron Microsc. 45:1996;79-84.
    • (1996) J. Electron Microsc. , vol.45 , pp. 79-84
    • Kurata, H.1    Moriguchi, S.2    Isoda, S.3    Kobayashi, T.4
  • 25
    • 0022734165 scopus 로고
    • High-resolution imaging magnetic energy filters with simple structure
    • Lanio S. High-resolution imaging magnetic energy filters with simple structure. Optik. 73:1986;56-68.
    • (1986) Optik , vol.73 , pp. 56-68
    • Lanio, S.1
  • 26
    • 0342282331 scopus 로고
    • High resolution electron microscopy and microanalysis
    • Pennycook S. J. High resolution electron microscopy and microanalysis. Contemp. Phys. 23:1982;371-400.
    • (1982) Contemp. Phys. , vol.23 , pp. 371-400
    • Pennycook, S.J.1
  • 27
    • 84985283324 scopus 로고
    • Optimized acquisition parameters and statistical detection limit in quantitative EELS
    • Pun T., Ellis J. R., Eden M. Optimized acquisition parameters and statistical detection limit in quantitative EELS. J. Microsc. 135:1984;295-316.
    • (1984) J. Microsc. , vol.135 , pp. 295-316
    • Pun, T.1    Ellis, J.R.2    Eden, M.3
  • 28
    • 0028533344 scopus 로고
    • Correction of aberrations, a promising means for improving the spatial resolution and energy resolution of energy-filtering electron microscopes
    • Rose H. Correction of aberrations, a promising means for improving the spatial resolution and energy resolution of energy-filtering electron microscopes. Ultramicroscopy. 56:1994;11-25.
    • (1994) Ultramicroscopy , vol.56 , pp. 11-25
    • Rose, H.1
  • 29
    • 0022484844 scopus 로고
    • Elemental imaging and resolution in energy-filtered conventional electron microscopy
    • Shuman H., Chang C. F., Somlyo A. P. Elemental imaging and resolution in energy-filtered conventional electron microscopy. Ultramicroscopy. 19:1986;121-134.
    • (1986) Ultramicroscopy , vol.19 , pp. 121-134
    • Shuman, H.1    Chang, C.F.2    Somlyo, A.P.3
  • 30
    • 0026654157 scopus 로고
    • A new background subtraction for low-energy EELS core edges
    • Tenailleau H., Martin J. M. A new background subtraction for low-energy EELS core edges. J. Microsc. 166:1992;297-306.
    • (1992) J. Microsc. , vol.166 , pp. 297-306
    • Tenailleau, H.1    Martin, J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.