Multivariate statistical analysis of FEG-STEM EDX spectra

Journal of Microscopy

Volumn 184, Issue 3, 1996, Pages 195-207

  Titchmarsh, J M ^a   Dumbill, S ^b  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

^b Harwell Lab   (United Kingdom)

Author keywords

factor analysis; principal component; segregation; STEM EDX

Indexed keywords

GRAIN BOUNDARIES; METAL ANALYSIS; MULTIVARIANT ANALYSIS; SEGREGATION (METALLOGRAPHY); TRACE ELEMENTS;

EIGENSPECTRUM; FACTORS ANALYSIS; GRAIN-BOUNDARIES; INFORMATION CONTENTS; MULTIVARIATE STATISTICAL ANALYSIS; PRINCIPAL COMPONENTS; SEGREGATION; SPECTRA'S; STATISTICAL ANALYSIS METHODS; STEM-EDX;

PRINCIPAL COMPONENT ANALYSIS;

ARTICLE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030473209     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.1400698.x     Document Type: Article

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