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Volumn 66, Issue 3-4, 1996, Pages 261-275

Computation and interpretation of contrast in crystal lattice images formed by inelastically scattered electrons in a transmission electron microscope

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTALLINE MATERIALS; ELASTICITY; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030441580     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00007-7     Document Type: Article
Times cited : (25)

References (20)
  • 13
    • 11744308897 scopus 로고
    • Eds. U. Valdrè and E. Ruedl Commission of the European Communities, Luxembourg
    • [13] A.J.F. Metherell, in: Electron Microscopy in Materials Science, Part II, Eds. U. Valdrè and E. Ruedl (Commission of the European Communities, Luxembourg, 1975) p. 397.
    • (1975) Electron Microscopy in Materials Science , Issue.PART II , pp. 397
    • Metherell, A.J.F.1
  • 15
    • 0011224864 scopus 로고
    • [15] G. Radi, Z. Phys. 212 (1968) 146.
    • (1968) Z. Phys. , vol.212 , pp. 146
    • Radi, G.1
  • 16
    • 0011184854 scopus 로고
    • Dissertation D83, TU Berlin
    • [16] H.-J. Kohl, Dissertation D83, TU Berlin (1987).
    • (1987)
    • Kohl, H.-J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.