Analysis of diffraction contrast as a function of energy loss in energy- filtered transmission electron microscope imaging

Ultramicroscopy

Volumn 80, Issue 3, 1999, Pages 203-219

  Moore, K T ^a   Howe, J M ^b   Elbert, D C ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

^b University of Virginia   (United States)

Author keywords

Diffraction contrast; Elastic scattering; Electron energy loss spectroscopy (EELS); Energy filtered imaging (EFI); Energy filtering transmission electron microscopy (EFTEM); Inelastic scattering; Jump ratio image; Transmission electron microscopy (TEM)

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; IMAGING TECHNIQUES; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY-FILTERED IMAGING; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPY (EFTEM);

ALUMINUM;

ELECTRON DIFFRACTION; IMAGE ANALYSIS; IMAGE INTENSIFIER; MATHEMATICAL ANALYSIS; REVIEW; SIGNAL PROCESSING; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ANGUILLIFORMES;

EID: 0032753269     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00113-8     Document Type: Article

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