Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding

Surface Science Reports

Volumn 68, Issue 1, 2013, Pages 108-230

  Wittmaack, Klaus ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

Adatoms; Cs deposition; Electronegativity; Implantation; Ion induced electron emission; Local potential; Secondary ion formation; Site specific chemistry; Tunnelling model; Velocity dependence; Work function; Yield enhancement

Indexed keywords

ADATOMS; ATOMS; CALIBRATION; CESIUM; CHARGE TRANSFER; CHEMICAL BONDS; ELECTRON AFFINITY; ELECTRONEGATIVITY; EROSION; INERT GASES; INTERCALATION; ION BEAM LITHOGRAPHY; ION BOMBARDMENT; LITHIUM; MOLECULAR DYNAMICS; MONOLAYERS; NEGATIVE IONS; OXIDATION; OXYGEN; PLASMA INTERACTIONS; POSITIVE IONS; PROBABILITY; SCANNING TUNNELING MICROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; SPECTROSCOPY; TURBULENT FLOW; VAPOR DEPOSITION; VELOCITY; WORK FUNCTION;

ION INDUCED ELECTRON EMISSION; LOCAL POTENTIALS; SECONDARY IONS; SITE-SPECIFIC; VELOCITY DEPENDENCE; YIELD ENHANCEMENT;

ION IMPLANTATION;

EID: 84875430329     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2012.11.001     Document Type: Review

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