Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces

Surface Science

Volumn 441, Issue 1, 1999, Pages 213-222

  Tolstogouzov, A ^a   Daolio, S ^a   Pagura, C ^a  

^a Ist Polarografia Ed E   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ENERGY DISSIPATION; IONS; ISOTOPES; MASS SPECTROMETRY; NEON; SILICON;

LOW-ENERGY ION SCATTERING (LEIS);

SURFACE PHENOMENA;

EID: 0033363353     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00881-X     Document Type: Article

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