Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 6413-6418

  Wittmaack, K ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

Additivity of yields; Polymer layers; Sample consumption; Sputtering yields; Yield enhancement

Indexed keywords

MOLECULAR DYNAMICS; MONOLAYERS; POLYMER BLENDS; SPUTTERING; SURFACE PHENOMENA;

ADDITIVITY OF YIELDS; POLYMER LAYERS; SAMPLE CONSUMPTION; SPUTTERING YIELDS; YIELD ENHANCEMENT;

SECONDARY ION MASS SPECTROMETRY;

EID: 33747161058     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.086     Document Type: Article

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