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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 183, Issue 3-4, 2001, Pages 476-486

Relative counting efficiencies of ion charge-states by microchannel plate

(6) Yagi, S a Nagata, T a Koide, M b Itoh, Y c Koizumi, T d Azuma, Y e

a MEISEI UNIVERSITY (Japan)

b UNIVERSITY OF ELECTRO COMMUNICATIONS (Japan)

c JOSAI UNIVERSITY (Japan)

d RIKKYO UNIVERSITY (Japan)

e INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

Author keywords

Detection efficiency; Ion beam; Ion counting; Microchannel plate

Indexed keywords

ELECTRON ENERGY LEVELS; HEAVY IONS; SECONDARY EMISSION;

MICROCHANNEL PLATES;

ION BEAMS;

EID: 0035478312 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/S0168-583X(01)00724-8 Document Type: Article

Times cited : (27)

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