Cesium-induced transient effects on the Si+ and Si- secondary ion emissions from Si and SiO2

Surface Science

Volumn 447, Issue 1, 2000, Pages 62-72

  Van Der Heide, P A W ^a  

^a UNIVERSITY OF HOUSTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; CESIUM COMPOUNDS; CHARGE TRANSFER; ELECTRON TUNNELING; ION IMPLANTATION; METALLIC FILMS; SECONDARY ION MASS SPECTROMETRY; SILICA; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER DE-EXCITATION PROCESS;

SURFACE CHEMISTRY;

EID: 0033879048     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01121-8     Document Type: Article

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