Cesium ion sputtering with oxygen flooding: Experimental SIMS study of work function change

Applied Surface Science

Volumn 254, Issue 16, 2008, Pages 4961-4964

  Kudriatsev, Y ^a   Villegas, A ^a   Gallardo, S ^a   Ramirez, G ^a   Asomoza, R ^a   Mishurnuy, V ^b  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b INSTITUTO DE INVESTIGACIÓN EN COMUNICACIÓN ÓPTICA   (Mexico)

Author keywords

Ion yield; SIMS; Work function

Indexed keywords

ION BOMBARDMENT; NEGATIVE IONS; OXYGEN; SPUTTERING; SURFACE STRUCTURE;

OXYGEN FLOODING; SECONDARY ION YIELDS; SURFACE DIPOLES;

CESIUM;

EID: 43049183446     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.01.145     Document Type: Article

References (8)

1. M.L. Yu Charged and Excited States of Sputtered Atoms R. Behrisch K. Witmaack Sputtering by Particle Bombardment III 1991 Springer Berlin p. 91
2. A. Villegas Yu. Kudriavtsev A. Godines R. Asomoza Appl. Surf. Sci. vol. 203–204 2003 94 97
3. IMS-6f user's Guide, Cameca, France: 1995.
4. Yu. Kudriavtsev A. Villegas A. Godines R. Asomoza Appl. Surf. Sci. vol. 252 N10 2006 3406 3412
5. P. Williams C. Evans Surf. Sci. 78 1978 324 338
6. M. Kamaratos Appl. Surf. Sci. 185 2001 66 71
7. G.E. Rhead Appl. Surf. Sci. 47 1991 35 42
8. Yu. Kudriavtsev A. Villegas S. Gallardo R. Asomoza Ionization probability of sputtered particles as a function of their Energy. Part I: Negative Si ions Appl. Surf. Sci. 254 2008 2059 2066