Work function measurements of contact materials for industrial use

Journal of Physics D: Applied Physics

Volumn 31, Issue 11, 1998, Pages 1301-1308

  Akbi, Mohamed ^a   Lefort, André ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC ARCS; ELECTRIC CIRCUIT BREAKERS; NICKEL; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY; SILVER; SILVER COMPOUNDS; SURFACE TREATMENT; TIN; ZINC;

CONTACT MATERIALS; FOWLER METHOD; WORK FUNCTIONS;

ELECTRIC CONTACTS;

EID: 0032493143     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/11/003     Document Type: Article

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