Depth profiling studies of multilayer films with a C 60 + ion source

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 179-182

  Sostarecz, A G ^a   Sun, S ^a   Szakal, C ^a   Wucher, A ^b   Winograd, N ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

C 60 + cluster source; Depth profiling; Langmuir Blodgett film; TOF SIMS

Indexed keywords

BARIUM; CARBON; DEPOSITION; ISOTOPES; LANGMUIR BLODGETT FILMS; NANOTECHNOLOGY; SECONDARY ION MASS SPECTROMETRY; SPUTTERING;

CLUSTER SOURCES; DEPTH PROFILING; NEUTRAL ATOMS; ORGANIC FILMS;

MULTILAYERS;

EID: 2942623952     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.111     Document Type: Conference Paper

References (10)

1. Appelhans A.D., Delmore J.E. Anal. Chem. 61:1989;1087.
2. Fuoco E.R., Gillen G., Wijesundara M.B.J., Wallace W.E., Hanley L. J. Phys. Chem. B. 105:2001;3950.
3. Gillen G., Roberson S. Rapid Commun. Mass Spectrom. 12:1998;1303.
4. Kötter F., Benninghoven A. Appl. Surf. Sci. 133:1998;47.
5. Stapel D., Brox O., Benninghoven A. Appl. Surf. Sci. 140:1999;156.
6. Bulle-Lieuwma C.W.T., van Gennip W.J.H., van Duren J.K.J., Jonkheijm P., Janssen R.A.J., Niemantsverdriet J.W. Appl. Surf. Sci. 203/204:2003;547.
7. Gillen G., Simons D.S. Anal. Chem. 62:1990;2122.
8. Weibel D., Wong S., Lockyer N., Blenkinsopp P., Hill R., Vickerman J.C. Anal. Chem. 75:2003;1754.
9. Blodgett K.B. J. Phys. Chem. 41:1937;975.
10. Braun R.M., Blenkinsopp P., Mullock S.J., Corlett C., Willey K.F., Vickerman J.C., Winograd N. Rapid Commun. Mass Spectrom. 12:1998;1246.