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Volumn 66, Issue 1, 2011, Pages 1-27

Kelvin probe force microscopy and its application

Author keywords

Kelvin probe force microscopy; Scanning probe miscroscopy

Indexed keywords

PHOTOELECTRON SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS;

EID: 78649522892     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2010.10.001     Document Type: Review
Times cited : (1343)

References (107)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.