SCOPUS 정보 검색 플랫폼

Surface Science Reports

Volumn 66, Issue 1, 2011, Pages 1-27

Kelvin probe force microscopy and its application

(4) Melitz, Wilhelm a Shen, Jian a Kummel, Andrew C a Lee, Sangyeob a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

Kelvin probe force microscopy; Scanning probe miscroscopy

Indexed keywords

PHOTOELECTRON SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS;

CONTACT POTENTIAL DIFFERENCE; ELECTRICAL DEVICES; ELECTRON-BEAM-INDUCED CURRENT; KELVIN PROBE FORCE MICROSCOPY; METALLIC NANOSTRUCTURE; POTENTIAL MEASUREMENTS; SCANNING PROBE MISCROSCOPY; SURFACE WORK FUNCTIONS;

ELECTRIC CURRENTS;

EID: 78649522892 PISSN: 01675729 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfrep.2010.10.001 Document Type: Review

Times cited : (1343)

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