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Volumn 59, Issue 19, 1999, Pages 12298-12300

Work-function changes in high-dose b-implanted si with kev (formula presented) bombardment

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[No Author keywords available]

Indexed keywords


EID: 4243841946     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.12298     Document Type: Article
Times cited : (4)

References (32)
  • 3
    • 0042219499 scopus 로고
    • and references therein
    • H. P. Bonzel, Surf. Sci. Rep.8, 43 (1987), and references therein.
    • (1987) Surf. Sci. Rep. , vol.8 , pp. 43
    • Bonzel, H.P.1
  • 21
    • 85037917868 scopus 로고    scopus 로고
    • M.-C. Desjonquères and D. Spanjaard, (Springer-Verlag, Berlin, Heidelberg, 1993)
    • M.-C. Desjonquères and D. Spanjaard, Concepts in Surface Physics (Springer-Verlag, Berlin, Heidelberg, 1993).
  • 26
    • 85037880672 scopus 로고    scopus 로고
    • M. Bernheim and G. Slodzian, (Wiley, Chichester, 1988), p. 139
    • M. Bernheim and G. Slodzian, Proceedings of 6th International Conference on Secondary Ion Mass Spectrometry, SIMS VI (Wiley, Chichester, 1988), p. 139.
  • 29
    • 85037903430 scopus 로고    scopus 로고
    • The step of sample potential is modified by H & S Technology Inc., Kurokawa, Aso-ku, Kawasaki 215-0035, Japan
    • The step of sample potential is modified by H & S Technology Inc., Kurokawa, Aso-ku, Kawasaki 215-0035, Japan.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.