Work function shifts and variations of ionization probabilities occurring during SIMS analyses using an in situ deposition of Cs0

Surface Science

Volumn 561, Issue 2-3, 2004, Pages 200-207

  Wirtz, T ^a   Migeon, H N ^a  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

Author keywords

Alkali metals; Clusters; Evaporation and sublimation; Ion bombardment; Ion emission; Secondary ion mass spectroscopy; Sputtering

Indexed keywords

CESIUM; DEPOSITION; EVAPORATION; ION BOMBARDMENT; IONIZATION; PROBABILITY; SPUTTERING; SUBLIMATION;

CLUSTERS; DEPTH RESOLUTION; ION EMISSION; WORK FUNCTION SHIFTS;

SECONDARY ION MASS SPECTROMETRY;

EID: 3042740334     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.05.068     Document Type: Article

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