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Volumn 54, Issue 23, 1996, Pages 16456-16459
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Exponential scaling of sputtered negative-ion yields with transient work-function changes on-bombarded surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000492289
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.16456 Document Type: Article |
Times cited : (66)
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References (16)
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