Pitfalls in measuring work function using photoelectron spectroscopy

Applied Surface Science

Volumn 256, Issue 8, 2010, Pages 2602-2605

  Helander, M G ^a   Greiner, M T ^a   Wang, Z B ^a   Lu, Z H ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

Fermi level; Secondary electron cut off; Ultraviolet photoelectron spectroscopy; Work function

Indexed keywords

FERMI LEVEL; PHOTOELECTRONS; PHOTONS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

ACCURATE MEASUREMENT; DETECTOR GEOMETRY; ELECTRON DETECTORS; EXPERIMENTAL PARAMETERS; FUNCTION VALUES; KELVIN PROBE METHOD; RESEARCH AND DEVELOPMENT; SECONDARY ELECTRONS;

WORK FUNCTION;

EID: 74149087612     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.11.002     Document Type: Article

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