Molecular depth profiling of polymers with very low energy ions

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 970-972

  Houssiau, L ^a   Douhard, B ^a   Mine, N ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Cs sputtering; Organic depth profile; Oxygen sputtering; PET; PMMA

Indexed keywords

ION BEAMS; IONS; PLASTIC BOTTLES; POLYETHYLENE TEREPHTHALATES; POLYMERS;

CLUSTER ION BEAMS; CS SPUTTERING; MOLECULAR DEPTH PROFILING; MOLECULAR INFORMATION; ORGANIC DEPTH PROFILE; OXYGEN SPUTTERING; PMMA; POLYETHYLENE TEREPHTHALATES (PET);

DEPTH PROFILING;

EID: 56449124172     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.027     Document Type: Article

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