A TRIDYN study: Comparison of experimental SIMS useful yields with simulated Cs concentration evolution

International Journal of Mass Spectrometry

Volumn 261, Issue 2-3, 2007, Pages 91-99

  Philipp, P ^a   Wirtz, T ^a   Migeon, H N ^a   Scherrer, H ^b  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^b INSTITUT JEAN LAMOUR   (France)

Author keywords

Cesium surface concentration; Neutral cesium deposition; Secondary Ion Mass Spectrometry; TRIDYN; Useful yield

Indexed keywords

EID: 33846980788     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.07.020     Document Type: Article

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