SCOPUS 정보 검색 플랫폼

International Journal of Mass Spectrometry

Volumn 209, Issue 1, 2001, Pages 57-67

Useful yields of MCs+ and MCs2+ clusters: A comparative study between the Cameca IMS 4f and the Cation Mass Spectrometer

(4) Wirtz, T a Duez, B a Migeon, H N a Scherrer, H b

a CRP Gabriel Lippmann (France)

b INSTITUT JEAN LAMOUR (France)

Author keywords

Cesium clusters; Quantification; Secondary ion mass spectrometry; Stationary cesium surface concentration; Useful yield

Indexed keywords

ARSENIC DERIVATIVE; BORON DERIVATIVE; CESIUM DERIVATIVE; FLUORINE DERIVATIVE; INDIUM; MAGNESIUM DERIVATIVE; METAL DERIVATIVE; SILICON; SULFUR DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL ANALYSIS; CONCENTRATION RESPONSE; INTERMETHOD COMPARISON; MASS SPECTROMETRY; SPECTROMETER; STOICHIOMETRY; SURFACE PROPERTY;

EID: 0035944241 PISSN: 13873806 EISSN: None Source Type: Journal
DOI: 10.1016/S1387-3806(01)00467-5 Document Type: Article

Times cited : (31)

References (24)

1
- 33847088543
- (1977) Anal. Chem. , vol.49 , pp. 2023
- Storms, H.A.¹ Brown, K.F.² Stein, J.D.³

2
- 33845921506
- (1988) J. Appl. Phys. , vol.64 , pp. 3760
- Gao, Y.¹

3
- 0002523064
- (1991) Anal. Chem. , vol.341 , pp. 54
- Gnaser, H.¹ Oechsner, H.² Fresenius, J.³

4
- 0001353551
- (1992) Nucl. Instrum. Methods Phys. Res. B , vol.64 , pp. 621
- Wittmaack, K.¹

5
- 33646614931
- (1990) Int. J. Mass Spectrom. Ion Processes , vol.103 , pp. 45
- Magee, C.W.¹ Harrington, W.L.² Botnick, E.M.³

6
- 0002775737
- (1988) J. Vac. Sci. Technol. A , vol.6 , pp. 44
- Ray, M.A.¹ Baker, J.E.² Loxton, C.M.³ Greene, J.E.⁴

7
- 0003776069
- A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner (Eds.), Wiley, Chichester
- (1994) Secondary Ion Mass Spectrometry SIMS IX , pp. 382
- Gao, Y.¹ Marie, Y.² Saldi, F.³ Migeon, H.-N.⁴

8
- 0002780039
- A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner (Eds.), Wiley, Chichester
- (1994) Secondary Ion Mass Spectrometry SIMS IX , pp. 406
- Gao, Y.¹ Marie, Y.² Saldi, F.³ Migeon, H.-N.⁴

9
- 0000702654
- (1996) Int. J. Mass Spectrom. Ion Processes , vol.152 , pp. 209
- Mootz, T.¹ Adams, F.²

10
- 0001180231
- (1983) Phys. Rev. Lett. , vol.50 , pp. 127
- Yu, M.L.¹ Lang, N.D.²

11
- 0001472659
- (1984) Phys. Rev. B , vol.29 , pp. 2311
- Yu, M.L.¹

12
- 0029207709
- (1995) Surf. Interface Anal. , vol.23 , pp. 38
- Marie, Y.¹ Gao, Y.² Saldi, F.³ Migeon, H.-N.⁴

13
- 0003101042
- (1999) J. Surf. Anal. , vol.5 , pp. 52
- Kan, T.¹ Mitsukawa, K.² Ueyama, T.³ Takada, M.⁴ Yasue, T.⁵ Koshikawa, T.⁶

14
- 0000675594
- (1994) Nucl. Instrum. Methods Phys. Res. B , vol.85 , pp. 374
- Wittmaack, K.¹

15
- 0002254818
- A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner (Eds.), Elsevier, Amsterdam
- (2000) Secondary Ion Mass Spectrometry SIMS XII , pp. 233
- Mootz, T.¹ Rasser, B.² Sudraud, P.³ Niehuis, E.⁴ Wirtz, T.⁵ Bieck, W.⁶ Migeon, H.-N.⁷

16
- 3643090763
- (1969) Phys. Rev. B , vol.184 , pp. 383
- Sigmund, P.¹

17
- 0000984103
- R. Behrisch (Eds.), Springer, Berlin
- (1981) Sputtering by Particle Bombardment I , pp. 145
- Andersen, H.H.¹ Bay, H.L.²

18
- 0003587776
- SIMION 3D, Version 6.0
- Dahl, D.A.¹

19
- 0001990130
- A. Benninghoven, R.J. Colton, D.S. Simons, H.W. Werner (Eds.), Springer, Berlin
- (1986) Secondary Ion Mass Spectrometry SIMS V , pp. 155
- Migeon, H.-N.¹ Le Pipec, C.² Le Goux, J.J.³

20
- 0002495967
- (1996) Int. J. Mass Spectrom. Ion Processes , vol.156 , pp. 1
- Mootz, T.¹ Adriaens, A.² Adams, F.³

21
- 0004093102
- Doctoral Thesis, Institut National Polytechnique de Lorraine
- (1995)
- Marie, Y.¹

22
- 0001636420
- (1979) Phys. Rev. B , vol.19 , pp. 5661
- Nørskov, J.K.¹ Lundqvist, B.I.²

23
- 0000478034
- (1983) Phys. Rev. B , vol.27 , pp. 2019
- Lang, N.D.¹

24
- 0001654712
- (1996) Phys. Rev. B , vol.54 , pp. 17141
- Gnaser, H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.