|
Volumn 180, Issue 1-4, 2001, Pages 58-65
|
Depth of origin of atoms sputtered from crystalline targets
|
Author keywords
Depth of origin; Sputtered atoms; Sputtering
|
Indexed keywords
CODES (SYMBOLS);
COMPUTER SIMULATION;
CRYSTALLINE MATERIALS;
MONTE CARLO METHODS;
SPUTTERING;
TARGETS;
CRYSTALLINE TARGETS;
ATOMIC BEAMS;
|
EID: 0035364052
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(01)00492-X Document Type: Conference Paper |
Times cited : (14)
|
References (36)
|