Ionization probability of atoms and molecules sputtered from a cesium covered silver surface

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 48-51

  Meyer, S ^a   Staudt, C ^a   Wucher, A ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Ionization probability; MCs SIMS; Molecule formation

Indexed keywords

DISSOCIATION; PROBABILITY; SECONDARY ION MASS SPECTROMETRY; SPUTTERING;

ION FRACTION;

IONIZATION;

EID: 0037438074     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00652-9     Document Type: Conference Paper

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