SIMS analysis of xenon and krypton in uranium dioxide: A comparison of two models of gas-phase ionisation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 24, 2008, Pages 5151-5158

  Wittmaack, K ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

34.70.+e; 68.49.Sf; 79.20.Rf; Charge transfer ionisation; Oxygen jet; Secondary ion mass spectrometry; Uranium oxide; Xenon

Indexed keywords

ATOMIC PHYSICS; ATOMS; CHARGE TRANSFER; CHEMICAL OXYGEN DEMAND; ELECTROLYSIS; EMISSION SPECTROSCOPY; EROSION; FLOW INTERACTIONS; GAS FUEL ANALYSIS; GASES; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; ION BOMBARDMENT; ION EXCHANGE; IONIZATION; IONS; JETS; KRYPTON; MASS SPECTROMETERS; MASS SPECTROMETRY; MASS TRANSFER; NONMETALS; OXIDATION; OXYGEN; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SOIL MECHANICS; SPECTROMETERS; SPECTROMETRY; SPECTRUM ANALYSIS; TRANSURANIUM ELEMENTS; URANIUM; URANIUM DIOXIDE; XENON;

34.70.+E; 68.49.SF; 79.20.RF; CHARGE-TRANSFER IONISATION; OXYGEN JET; URANIUM OXIDE;

INERT GASES;

EID: 56949105545     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.09.018     Document Type: Article

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