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Volumn 86, Issue 8, 2012, Pages

Detailed analysis of the silicon surface under low-energy oxygen bombardment at atomic resolution

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EID: 84865660004     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.085438     Document Type: Article
Times cited : (2)

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