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Volumn 460, Issue 1-3, 2000, Pages 214-222

Secondary ion emission processes of sputtered alkali ions from alkali/Si(100) and Si(111)

Author keywords

Alkali metals; Ion emission; Ion solid interactions; Secondary ion mass spectroscopy; Silicon; Sputtering; Surface electronic phenomena (work function, surface potential, surface states, etc.); Work function measurements

Indexed keywords


EID: 0000605882     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00535-5     Document Type: Article
Times cited : (15)

References (44)
  • 11
    • 0347246349 scopus 로고
    • Ph.D. thesis, TU Clausthal
    • U. Stawinski, Ph.D. thesis, TU Clausthal, 1989.
    • (1989)
    • Stawinski, U.1
  • 12
    • 0346616651 scopus 로고
    • A. Benninghoven et al. (Eds.), Wiley, Chichester, UK
    • T. Koshikawa, T. Yasue, K. Kojima, R.S. Li, in: A. Benninghoven et al. (Eds.), Proc. SIMS IX, Wiley, Chichester, UK, 1994, p. 116.
    • (1994) Proc. SIMS IX , pp. 116
    • Koshikawa, T.1    Yasue, T.2    Kojima, K.3    Li, R.S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.