Work function change caused by alkali ion sputtering

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 94-97

  Villegas, A ^a   Kudriavtsev, Yu ^a   Godines, A ^a   Asomoza, R ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

SIMS; Surface dipole; Work function

Indexed keywords

CESIUM; ELECTRIC FIELDS; ION BOMBARDMENT; SECONDARY ION MASS SPECTROMETRY; SPUTTERING;

SURFACE DIPOLE;

SILICON;

EID: 0037438128     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00706-7     Document Type: Conference Paper

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