Infrared ellipsometry on semiconductor layer structures phonons, plasmons, and polaritons

Springer Tracts in Modern Physics

Volumn 209, Issue , 2005, Pages 1-190

  Schubert, Mathias ^a  

^a NONE

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EID: 33947411292     PISSN: 00813869     EISSN: None     Source Type: Book Series    
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