Fourier Transform Infrared Synchrotron Ellipsometry for Studying the Anisotropy of Small Organic Samples

Applied Spectroscopy

Volumn 57, Issue 10, 2003, Pages 1250-1253

  Hinrichs, K ^a   Gensch, M ^a   Roseler A ^a   Korte, E H ^a   Sahre, K ^b   Eichhorn, K J ^b   Esser, N ^c   Schade, U ^d  

^a Department Berlin   (Germany)

^b LEIBNIZ INSTITUTE OF POLYMER RESEARCH DRESDEN   (Germany)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

Anisotropy; Fourier transform infrared; FT IR; Infrared reflection absorption spectroscopy; Infrared spectroscopic ellipsometry; Organic layer; Polymer; Synchrotron radiation

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; ELECTRONS; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POLARIZATION;

ORGANIC LAYERS;

SYNCHROTRONS;

ORGANIC COMPOUND; POLYIMIDE RESIN; RESIN;

ANISOTROPY; ARTICLE; CHEMISTRY; INFRARED SPECTROSCOPY; INSTRUMENTATION; METHODOLOGY; SYNCHROTRON;

ANISOTROPY; ORGANIC CHEMICALS; RESINS, SYNTHETIC; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SYNCHROTRONS;

EID: 0242274311     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370203769699117     Document Type: Article

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