Far-infrared ellipsometry using synchrotron radiation

Journal of the Optical Society of America B: Optical Physics

Volumn 14, Issue 4, 1997, Pages 705-712

  Kircher, J ^a,b,c   Henn, R ^a   Cardona, M ^a   Richards, P L ^b,c   Williams, G P ^d  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CRYSTAL GROWTH; ELECTRIC INSULATORS; ERRORS; HIGH TEMPERATURE SUPERCONDUCTORS; INFRARED RADIATION; LIGHT POLARIZATION; OSCILLATORS (ELECTRONIC); PERMITTIVITY; PHONONS; SEMICONDUCTING GALLIUM ARSENIDE; SYNCHROTRON RADIATION;

DIELECTRIC FUNCTION; FAR INFRARED ELLIPSOMETRY; IONIC INSULATOR; OPTICAL INTERPLANE CONDUCTIVITY; SELF FLUX TECHNIQUE;

ELLIPSOMETRY;

EID: 0031125852     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.14.000705     Document Type: Article

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