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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 11, 2000, Pages 7365-7377

Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry

(5) Kasic, A a Schubert, M a Einfeldt, S b Hommel, D b Tiwald, T E c

a UNIVERSITY OF NEBRASKA LINCOLN (United States)

b UNIVERSITY OF BREMEN (Germany)

c JA Woollam Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; NITROGEN;

ARTICLE; ELECTRON; ELEMENTARY PARTICLE; ELLIPSOMETRY; FILM; INFRARED SPECTROSCOPY; MEASUREMENT; PHYSICS;

EID: 0034664539 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.7365 Document Type: Article

Times cited : (265)

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