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Applied Physics Letters

Volumn 70, Issue 13, 1997, Pages 1668-1670

Infrared ellipsometry on hexagonal and cubic boron nitride thin films

(6) Franke, E a Neumann, H a Schubert, M b Tiwald, T E c Woollam, J A c Hahn, J d

a LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM (Germany)

b UNIVERSITY OF LEIPZIG (Germany)

c UNIVERSITY OF NEBRASKA LINCOLN (United States)

d CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005840859 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.118655 Document Type: Article

Times cited : (15)

References (15)

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