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Journal of Applied Physics

Volumn 80, Issue 7, 1996, Pages 4058-4062

Raman scattering study of GaN films

(3) Kirillov, Dimitry a Lee, Heon a Harris Jr , James S a

a STANFORD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743079802 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.363367 Document Type: Article

Times cited : (56)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.