Generalized ellipsometry for biaxial absorbing materials: Determination of crystal orientation and optical constants of Sb2S3

Optics Letters

Volumn 27, Issue 23, 2002, Pages 2073-2075

  Schubert, Mathias ^a,b   Dollase, Wayne ^c,d  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITÄT BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ANTIMONY COMPOUNDS; CRYSTAL ORIENTATION; REFRACTIVE INDEX; SINGLE CRYSTALS;

OPTICAL CONSTANTS;

ELLIPSOMETRY;

EID: 0036913629     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.27.002073     Document Type: Article

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