Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 8, 1996, Pages 4265-4274

  Schubert, Mathias ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001118048     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.4265     Document Type: Article

References (14)

1. A. C. Boccara, C. Pickering, and J. Rivory, in Proceedings of the First Conference on Spectroscopic Ellipsometry in Paris, 1993 (Elsevier, Amsterdam, 1993).
2. F. Abelés, Ann. Phys. (Paris) 5, 596 (1950).
3. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
4. D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972).
5. H. Wöhler, M. Fritsch, G. Haas and D. A. Mlynski, J. Opt. Soc. Am. A 5, 1554 (1988).
6. P. Yeh, Surf. Sci. 96, 41 (1980).
7. A more detailed comparison between the 4×4 matrix formalism developed, respectively, by Berreman (Ref. 4) and Yeh (Ref. 6) is given by P. J. Lin-Chung and S. Teitler, J. Opt. Soc. Am. A 6, 1657 (1989).
8. M. Shubert, B. Rheinländer, B. Johs, C. M. Herzinger, and J. A. Woollam, J. Opt. Soc. Am. A (to be published).
9. M. Schubert, B. Rheinländer and V. Gottschalch, Solid State Commun. 95, 723 (1995).
10. M. Schubert, C. Cramer, B. Rheinländer, C. H. Herzinger, B. Johs, and J. A. Woollam (unpublished).
11. K. Eidner, J. Opt. Soc. Am. A 6, 1657 (1989).
12. For eigenvalues from a uniaxial medium, see e.g., K. Eidner, G. Mayer, M. Schmidt and H. Schmiedel, Mol. Cryst. Liq. Cryst. 172, 191 (1989).
13. For (Formula presented) from a uniaxial medium with some special orientation of its optic axis, see, e.g., H. Wöhler, M. Fritsch, G. Haas and D. A. Mlynski, J. Opt. Soc. Am. A 8, 536 (1991).
14. Proceedings of the Symposium on Recent Developments in Ellipsometry, edited by N. M. Bashara, A. B. Buckman, and A. C. Hall (North-Holland, Amsterdam, 1969).