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Volumn 89, Issue 7, 2001, Pages 3720-3724

Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN

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Indexed keywords


EID: 0035308399     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1344913     Document Type: Article
Times cited : (35)

References (21)
  • 21
    • 22144462055 scopus 로고    scopus 로고
    • The pseudodielectric function 〈ε〉 renders a representation of the overall sample response through a strict transformation of the ellipsometric ratio ρ into dielectric function values using the isotropic single-phase ambient/substrate relation [see Ref. 7]. The complex quantity 〈ε〉 is not to be confused with real ε values. It is only intended here to serve for a convenient presentation
    • The pseudodielectric function 〈ε〉 renders a representation of the overall sample response through a strict transformation of the ellipsometric ratio ρ into dielectric function values using the isotropic single-phase ambient/substrate relation [see Ref. 7]. The complex quantity 〈ε〉 is not to be confused with real ε values. It is only intended here to serve for a convenient presentation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.