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Volumn 313-314, Issue , 1998, Pages 1-9

Spectroscopic ellipsometry: A historical overview

Author keywords

Characterization of surfaces, interfaces; Dielectric functions; Multilayer structures; Non destructive; Real time monitoring and control; Spectroscopic ellipsometry; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY GAP; INTERFACES (MATERIALS); MULTILAYERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE ROUGHNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032001218     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00762-1     Document Type: Article
Times cited : (170)

References (59)
  • 7
    • 0345967218 scopus 로고
    • E.D. Palik (Ed.) Handbook of Optical Constants, Academic Press, New York, Vol. 1, 1985; Vol. 2, 1991.
    • (1991) Handbook of Optical Constants , vol.2
  • 42
    • 0000294541 scopus 로고
    • K. Vedam (Ed.), Academic Press, New York
    • P. Chindaudom, K. Vedam, in: K. Vedam (Ed.), Physics of Thin Films, Academic Press, New York, Vol. 19, 1994, p. 191.
    • (1994) Physics of Thin Films , vol.19 , pp. 191
    • Chindaudom, P.1    Vedam, K.2
  • 45
    • 0041542479 scopus 로고
    • Academic Press, New York
    • F. Abeles, Physics of Thin Films, Academic Press, New York, Vol. 6, 1971, p. 151.
    • (1971) Physics of Thin Films , vol.6 , pp. 151
    • Abeles, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.